The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Nov. 09, 2018
Kayak Software Corporation, Stamford, CT (US);
Kaijian Gao, Boston, MA (US);
Trevor Glenn Elkins, Watertown, MA (US);
Lauren Anne Ko, Somerville, MA (US);
Rebecca Chen, Cambridge, MA (US);
Giorgos C. Zacharia, Winchester, MA (US);
KAYAK Software Corporation, Stamford, CT (US);
Abstract
Systems and methods for object measurement in accordance with aspects of the disclosure are described. One embodiment of the invention includes a system including a processor, a memory in communication with the processor, an input device, and an image capture device, wherein the processor obtains image data using the image capture device in response to input received from the input device indicating that image data should be captured, identifies a set of feature points within the obtained image data, completes the obtaining of the image data based on the set of feature points identified and in response to input received from the input device indicating that image data should no longer be captured, generates a model based on the set of feature points, measures the generated model with respect to a reference plane, and provides an indication of the measured size of the generated model.