The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Dec. 05, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Dmitry Nikolayevich Znamenskiy, Eindhoven, NL;
Kamana Sigdel, Eindhoven, NL;
Marc Van Driel, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A system and method are provided which use a machine learning algorithm to obtain a learned annotation of objects in one or more scales of a multiscale image. A viewing window () is provided for viewing the multiscale image. The viewing window is configurable on the basis of a magnification factor, which selects one of the plurality of scales for viewing, and a spatial offset parameter. A user may provide a manual annotation of an object in the viewing window, which is then used as training feedback in the learning of the machine learning algorithm. To enable the user to more effectively provide the manual annotation, the magnification factor and the spatial offset parameter for the viewing window may be automatically determined, namely by the system and method determining where in the multiscale image the manual annotation of the object would have sufficient influence on the learned annotation provided by the machine learning algorithm. The determined influence may be shown in the form of an overlay () in the viewing window.