The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Mar. 14, 2019
Nanjing University of Aeronautics and Astronautics, Jiangsu, CN;
Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;
Shengjun Huang, Shenzhen, CN;
Nengneng Gao, Shenzhen, CN;
Kun Yuan, Shenzhen, CN;
Wei Chen, Shenzhen, CN;
Di Wang, Shenzhen, CN;
NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS, Jiangsu, CN;
TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Guangdong, CN;
Abstract
A sample selection method and apparatus and a server belong to the field of metric learning technologies. The method includes: selecting n sample pairs from an unlabeled sample set, each sample pair including two samples, and each sample including data in p modalities; calculating a partial similarity between data that is in each modality and that is of one sample included in the sample pair and data that is in each modality and that is of the other sample, to obtain p×p partial similarities; calculating, according to the p×p partial similarities, an overall similarity between the two samples included in the sample pair; obtaining a degree of difference between the p×p partial similarities and the overall similarity; and selecting a sample pair that meets a preset condition and that is in the n sample pairs as a training sample. In this application, training samples of high quality are selected to train a metric model, so that the metric model of higher precision can be trained by using fewer training samples.