The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Jul. 11, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Deepavali Bhagwat, Cupertino, CA (US);

Nilesh Bhosale, Warje, IN;

Joseph Dain, Vail, AZ (US);

James Hewitt, Eastleigh, GB;

Dean Hildebrand, Bellingham, WA (US);

Wayne Sawdon, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/22 (2019.01); G06F 16/242 (2019.01); G06F 16/25 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2228 (2019.01); G06F 16/243 (2019.01); G06F 16/2465 (2019.01); G06F 16/256 (2019.01);
Abstract

Embodiments for triggering custom metadata extraction by a processor. Information may be extracted from an event so as to access data across a plurality of heterogeneous storage systems. Metadata may be extracted from the data that is accessed such that the metadata is assigned as custom metadata and indexed into a centralized search index, wherein the custom metadata is correlated to existing metadata associated with the data in the centralized search index.


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