The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Aug. 06, 2019
International Business Machines Corporation, Armonk, NY (US);
Ram Sai Manoj Bamdhamravuri, Poughkeepsie, NY (US);
Deanna Postles Dunn Berger, Hyde Park, NY (US);
Mark R. Hodges, Endicott, NY (US);
Kenneth D. Klapproth, Austin, TX (US);
Guy G. Tracy, Austin, TX (US);
Craig R. Walters, Highland, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Methods, systems and computer program products for measuring hardware performance are provided. Aspects include receiving an indication of a start to a hardware operation. A number of clock cycles are counted from the start of a hardware operation to the completion of the hardware operation. A first region comprising a first set of bit location is defined. A second and third region is defined each including a set of bit locations. Based on the first set of bit locations being equal to zero, a granularity flag is set to zero in the sample buffer and the second and third set of bit locations are written to the sample buffer. And based on the first set of bit locations being greater than zero, the granularity flag in the sample buffer is set to one and the first and second set of bit locations are written to the sample buffer.