The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Mar. 18, 2019
Applicant:

Shenzhen Epostar Electronics Limited Co., Shenzhen, CN;

Inventors:

Yu-Hua Hsiao, Hsinchu County, TW;

Chia-Wei Chang, Kaohsiung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G11C 16/26 (2006.01); G11C 29/52 (2006.01); G06F 11/10 (2006.01); H03K 23/00 (2006.01); G11C 16/04 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01); G06F 11/1068 (2013.01); G11C 16/26 (2013.01); G11C 29/52 (2013.01); G11C 11/5642 (2013.01); G11C 11/5671 (2013.01); G11C 16/0483 (2013.01); H03K 23/005 (2013.01);
Abstract

A data reading method is provided. The method includes using X read voltage sets to read a target word line, so as to obtain X read results; in a first order, updating a final Gray code index of each of a plurality of target memory cells of the target word line, and obtaining (X−1) abnormal Gray code count sets according to the X read results, wherein an iread result among the X read results includes a Gray code corresponding to an iread voltage set of each of the target memory cells, and the Gray code corresponds to one of N Gray code indexes; and selecting (N−1) optimized read voltages from (X−1)*(N−1) read voltages of the corresponding (X−1) read voltage sets to form an optimized read voltage set according to the obtained (X−1) abnormal Gray code count sets.


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