The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Mar. 23, 2018
Applicant:
Olympus Corporation, Hachioji, JP;
Inventor:
Hitoshi Echigo, Sagamihara, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G03B 15/00 (2006.01); G03B 5/00 (2006.01); H04N 5/225 (2006.01); G06K 9/20 (2006.01); G02F 1/133 (2006.01); G02F 1/13357 (2006.01); A61B 5/117 (2016.01); G03B 19/02 (2006.01);
U.S. Cl.
CPC ...
G02F 1/133526 (2013.01); G02F 1/1336 (2013.01); G02F 1/13306 (2013.01); G03B 5/00 (2013.01); G03B 15/00 (2013.01); G06K 9/209 (2013.01); H04N 5/2254 (2013.01); H04N 5/2256 (2013.01); A61B 5/117 (2013.01); G03B 19/023 (2013.01);
Abstract
An imaging device includes an illuminator, a stage, a plurality of microlenses, an imaging element, and a controller. The controller is configured to control at least one of an irradiation position of light beams from the illuminator, and the position of the plurality of microlenses to realize a first state and a second state. A first angle of the light beams incident to each of the plurality of microlenses in the first state and a second angle of the light beams incident to each of the plurality of microlenses in the second state are different from each other.