The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
May. 05, 2017
Applicant:
The Medical College of Wisconsin, Inc., Milwaukee, WI (US);
Inventors:
Kevin M. Koch, Wauwatosa, WI (US);
Suryanarayanan Kaushik, Milwaukee, WI (US);
Assignee:
The Medical College of Wisconsin, Inc., Milwaukee, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01); G01R 33/56 (2006.01); G01R 33/24 (2006.01); G01R 33/58 (2006.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56536 (2013.01); G01R 33/243 (2013.01); G01R 33/5607 (2013.01); A61B 5/055 (2013.01); G01R 33/58 (2013.01);
Abstract
Described here are systems and methods for using a magnetic resonance imaging ('MRI') system to estimate parameters of spectral profiles contained in multispectral data acquired using multispectral imaging ('MSI') techniques, such as MAVRIC. These spectral profile parameters are reliably extracted using an iterative perturbation theory technique and utilized in a number of different applications, including fat suppression, artifact correction, and providing accelerated data acquisitions.