The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Jun. 29, 2017
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Jin-Hyung Lim, Daejeon, KR;

Du-Seong Yoon, Daejeon, KR;

Won-Tae Joe, Daejeon, KR;

Yong-Seok Choi, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/385 (2019.01); H01M 10/0525 (2010.01); H01M 10/44 (2006.01); H01M 10/48 (2006.01); G01R 31/36 (2020.01); G01R 31/396 (2019.01); G01R 31/3842 (2019.01); G01R 31/388 (2019.01); G01R 31/367 (2019.01);
U.S. Cl.
CPC ...
G01R 31/386 (2019.01); G01R 31/36 (2013.01); G01R 31/367 (2019.01); G01R 31/388 (2019.01); G01R 31/3842 (2019.01); G01R 31/396 (2019.01); H01M 10/0525 (2013.01); H01M 10/44 (2013.01); H01M 10/48 (2013.01); Y02E 60/10 (2013.01); Y02T 10/70 (2013.01);
Abstract

Provided are apparatus and method of testing electrochemical performance of a battery cell in a nondestructive manner The apparatus according to an embodiment of the present disclosure includes: a memory configured to store first profile data, second profile data, a first positive electrode upper limit, a first positive electrode lower limit, a first negative electrode upper limit, and a first negative electrode lower limit that are determined in advance through a preliminary experiment with respect to each of a plurality of reference cells; a sensing unit configured to measure an open-circuit voltage of a test cell according to a variation in a state of charge (SOC) of the test cell; and a controller electrically connected to the memory and the sensing unit. The controller is configured to test performance of the test cell in a nondestructive manner based on data regarding the reference cells and data measured by the sensing unit stored in the memory.


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