The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Oct. 18, 2017
Hand Held Products, Inc., Fort Mill, SC (US);
H. Sprague Ackley, Seattle, WA (US);
Jeffrey Mark Hunt, Kirkland, WA (US);
HAND HELD PRODUCTS, INC., Fort Mill, SC (US);
Abstract
Systems and methods for determining the integrity of metrology systems are provided. A method according to one implementation includes the step of storing, with a computer having a system clock, an initialization time at which a device is connected to the computer. The method also includes receiving, with the computer, information obtained by the device and associating an electronic timestamp to the information. The electronic timestamp is based on the system clock when the computer receives the information obtained by the device. The method also includes counting clock cycles to determine an elapsed time from the initialization time to the time when the computer receives the information obtained by the device. Also, the method determines if the system clock has been altered by comparing the electronic timestamp to the sum of the initialization time and the elapsed time.