The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Jan. 24, 2017
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Hidetsugu Tanoue, Tokyo, JP;

Yoichiro Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01F 23/26 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1009 (2013.01); G01F 23/26 (2013.01); G01N 35/10 (2013.01); G01N 35/1002 (2013.01); G01N 35/1065 (2013.01); G01N 2035/1025 (2013.01);
Abstract

In preparation for a case in which the time at which a first reagent probe comes into contact with cleaning liquid and the time at which a second reagent probe comes into contact with cleaning liquid are the same, an automated analyzer is provided with a charge accumulation unit that is provided between a supply port comprising a conductive material that is electrically connected to the cleaning liquids and a device housing and has a capacitance that is greater than or equal to that of the first reagent probe and second reagent probe. As a result, it is possible to prevent interference between the liquid-surface contact determination units of a plurality of probes.


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