The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
May. 20, 2016
Denka Seiken Co., Ltd., Tokyo, JP;
Risa Kohiyama, Gosen, JP;
Osamu Ishikawa, Gosen, JP;
Yuki Shinohara, Gosen, JP;
Takashi Miyazawa, Gosen, JP;
DENKA SEIKEN CO., LTD., Tokyo, JP;
Abstract
Disclosed is an immunochromatographic test strip by which the influences by the interfering substances in the immunochromatography method, contained in test samples, are reduced, so that it enables to accurately and specifically measure a test substance in a test sample irrespective of the amount of the test sample supplied to the assay, and to provide an immunochromatography method using the immunochromatographic test strip. The immunochromatographic test strip includes, in the order from upstream, a sample pad, a labeled substance region, a detection region and an absorption band, wherein a polymer(s) in which hydrophobic cyclic monomer(s) having an ionic functional group(s) is/are polymerized is impregnated at a region(s) upstream of the labeled substance region.