The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Jan. 31, 2017
Applicant:
Agilent Technologies, Inc., Santa Clara, CA (US);
Inventor:
Andrew C. Neilson, Sunapee, NH (US);
Assignee:
AGILENT TECHNOLOGIES, INC., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/497 (2006.01); B01D 63/08 (2006.01); B01D 69/10 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/497 (2013.01); B01D 63/088 (2013.01); B01D 69/10 (2013.01); B01L 3/50255 (2013.01); B01D 2313/56 (2013.01); B01L 2200/0694 (2013.01); B01L 2200/143 (2013.01); B01L 2200/148 (2013.01); B01L 2300/0618 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/0681 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/0851 (2013.01); B01L 2300/16 (2013.01); B01L 2400/0478 (2013.01); G01N 2033/4977 (2013.01);
Abstract
An apparatus for calibrating a flux analyzer comprises a first frame; a second frame; and a permeable membrane. The first frame and the second frame are connected or integrally formed. A method for calibrating a flux analyzer is provided which uses an artificial standard rather than a biological standard.