The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Mar. 09, 2016
Central South University, Hunan, CN;
Hongying Li, Hunan, CN;
Jiaojiao Liu, Hunan, CN;
CENTRAL SOUTH UNIVERSITY, Hunan, CN;
Abstract
A method for testing a phase transformation point of aluminium alloy, comprising cutting an aluminium alloy material to obtain at least three samples to be tested; performing heat treatment on a first sample to be tested to obtain a first resistivity-temperature curve; respectively performing quenching treatment and annealing treatment on a second sample to be tested and a third sample to be tested to obtain the second sample to be tested at a quenched state and the third sample to be tested at a fully annealed state, and respectively heating the second sample to be tested at a quenched state and the third sample to be tested at a fully annealed state to obtain a second resistivity-temperature curve and a third resistivity-temperature curve; obtaining a relative resistivity-temperature curve; and determining a phase transformation starting temperature and a phase transformation termination temperature of the sample to be tested according to the relative resistivity-temperature curve. By means of this method, a phase transformation behavior and a phase transformation temperature under a non-linear cooling condition can be tested. The range of a cooling rate which can be tested in the method is wide, and a phase transformation behavior of a small volume fraction and precipitated phase information about a small size can be captured.