The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Mar. 12, 2018
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Kyoto University, Kyoto, JP;
Hidefumi Takamine, Shinagawa, JP;
Kazuo Watabe, Yokohama, JP;
Tomoki Shiotani, Kyoto, JP;
Takahiro Nishida, Kyoto, JP;
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Kyoto University, Kyoto, JP;
Abstract
According to one embodiment, a structure evaluation system includes an impact imparting unit, a sensor, and a structure evaluation device. The impact imparting unit applies impacts to a structure. The impact imparting unit applies the impacts at a frequency equal to or less than a frequency determined in accordance with an intensity at which the impacts are imparted. The sensor detects elastic waves. The structure evaluation device evaluates a deterioration state of the structure on the basis of the detected elastic waves.