The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Aug. 29, 2018
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Wen-Yun Wu, Beijing, CN;
Dong-Qi Li, Beijing, CN;
Jin Zhang, Beijing, CN;
Kai-Li Jiang, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for imaging 1-D nanomaterials is provided. The method includes: providing a 1-D nanomaterials sample; immersing the 1-D nanomaterials sample in a liquid; illuminating the 1-D nanomaterials sample by a first incident light and a second incident light to cause resonance Rayleigh scattering, wherein the first incident light and the second incident light are not parallel to each other; and acquiring a resonance Rayleigh scattering image of the 1-D nanomaterials sample with a microscope.