The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Jun. 28, 2017
Applicant:

The University of Canterbury, Christchurch, NZ;

Inventor:

Mofreh Saleh, Christchurch, NZ;

Assignee:

UNIVERSITY OF CANTERBURY, Christchurch, NZ;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/34 (2006.01); G01N 3/56 (2006.01); G01N 19/00 (2006.01); E01C 7/14 (2006.01); G01N 33/42 (2006.01);
U.S. Cl.
CPC ...
G01N 3/34 (2013.01); G01N 3/56 (2013.01); G01N 19/00 (2013.01); E01C 7/14 (2013.01); G01N 33/42 (2013.01);
Abstract

A rut testing apparatus for testing the susceptibility of a pavement specimen to rutting has a specimen holder for supporting the specimen to be tested, a wheel, and a sensor. The specimen holder is arranged to support the specimen from below and to support two opposite ends of the specimen. The specimen holder is arranged to allow the specimen to deform in a lateral direction LD that is transverse to a direction that extends between the opposite ends. The wheel is arranged to move along at least part of the specimen in the direction that extends between the opposite ends. The sensor determines deformation of the specimen in the lateral direction LD.


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