The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2021
Filed:
Oct. 29, 2015
Carl Zeiss Vision International Gmbh, Aalen, DE;
Monique Welscher, Aalen, DE;
Timo Kratzer, Aalen, DE;
Carl Zeiss Vision International GmbH, Aalen, DE;
Abstract
The invention is directed to a system for determining the refractive properties of an eye. The system includes a wavefront measurement device for measuring the refractive properties of the eye. The system is configured to have at least one measurement mode assigned to children, wherein the system has an input device configured to switch the system into one of the at least one measurement mode assigned to children. The system is further configured to alter at least one of a group including a default pupillary distance, a default cornea vertex distance, a default position of the wavefront measurement device, a default position and/or direction of a measurement ray of the wavefront measurement device, a default position of a forehead and chin rest assembly of the system and a fixation target when the system is switched into the one of the at least one measurement mode assigned to children.