The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Feb. 28, 2020
Applicant:

Sorama, Eindhoven, NL;

Inventors:

Patrick Wijnings, Eindhoven, NL;

Rick Scholte, Eindhoven, NL;

Assignee:

Sorama B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04R 3/00 (2006.01); H04R 1/40 (2006.01); H04R 29/00 (2006.01);
U.S. Cl.
CPC ...
H04R 3/005 (2013.01); H04R 1/406 (2013.01); H04R 29/005 (2013.01); H04R 2201/003 (2013.01); H04R 2201/401 (2013.01); H04R 2410/03 (2013.01);
Abstract

Microphone array calibration that does not require a calibrated source or calibrated reference microphone is provided. We provide a statistical (Bayesian) algorithm that (under condition of reasonable environment noise during calibration) can determine gain and phase differences of a whole array at once, even when the gain and/or phase of the source is unknown. More specifically, a Bayesian regression with complex log-normal prior and complex normal likelihood is employed. The inherent phase-wrapping ambiguity in this regression is resolved by exploiting the similarity of likelihood between a lattice point and its Euclidean Voronoi region.


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