The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

May. 30, 2018
Applicant:

Jumio Corporation, Palo Alto, CA (US);

Inventors:

Attila Balogh, Vienna, AT;

Reinhard Hochrieser, Linz, AT;

Radu Rogojanu, Vienna, AT;

Assignee:

Jumio Corporation, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06N 20/00 (2019.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
H04L 63/0861 (2013.01); G06K 9/00483 (2013.01); G06N 20/00 (2019.01);
Abstract

Computer systems and methods are provided for using a machine learning system to analyze authentication information. First authentication information for a first transaction includes at least a first image that corresponds to a first identification document is received. First validation information that corresponds to a first validation fault is received from a validation system. Data storage of a machine learning system stores the first validation information. Second authentication information for a second transaction includes a second image that corresponds to a second image is received. The machine learning system determines a first validation value that corresponds to a probability that the second image includes the first validation fault. The first validation value is used to determine whether fault review criteria are met. In accordance with a determination that the fault review criteria are met, the second image is transmitted to the validation system.


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