The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Feb. 13, 2020
Applicant:

Inphi Corporation, Santa Clara, CA (US);

Inventors:

Benjamin P. Smith, Ottawa, CA;

Jamal Riani, Fremont, CA (US);

Sudeep Bhoja, San Jose, CA (US);

Arash Farhoodfar, Santa Clara, CA (US);

Vipul Bhatt, Los Altos, CA (US);

Assignee:

INPHI CORPORATION, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/69 (2013.01); H04B 10/58 (2013.01); H04B 10/2507 (2013.01); H04B 10/54 (2013.01); H04B 10/516 (2013.01); H04B 10/00 (2013.01);
U.S. Cl.
CPC ...
H04B 10/58 (2013.01); H04B 10/00 (2013.01); H04B 10/2507 (2013.01); H04B 10/25073 (2013.01); H04B 10/5161 (2013.01); H04B 10/541 (2013.01); H04B 10/697 (2013.01); H04B 10/6971 (2013.01);
Abstract

A circuit and method for mitigating multi-path interference in direct detection optical systems is provided. Samples of an optical signal having a pulse amplitude modulated (PAM) E-field are processed by generating a PAM level for each sample. For each sample, the sample is subtracted from the respective PAM level to generate a corresponding error sample. The error samples are lowpass filtered to produce estimates of multi-path interference (MPI). For each sample, one of the estimates of MPI is combined with the sample to produce an interference-mitigated sample.


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