The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Dec. 31, 2018
Applicants:

SK Hynix Inc., Gyeonggi-do, KR;

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Jeong Seok Ha, Daejeon, KR;

Ji Eun Oh, Daejeon, KR;

Dae-Sung Kim, Gyeonggi-do, KR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/11 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1131 (2013.01); H03M 13/1108 (2013.01); H03M 13/1125 (2013.01); H03M 13/1128 (2013.01); H03M 13/1575 (2013.01);
Abstract

A decoding method for a low density parity check (LDPC) code includes: updating a first check node, among a plurality of check nodes, by receiving, by the first check node, a bit decision and an associated first reliability value from each of a subset of variable nodes including a first variable node among a plurality of variable nodes, calculating a syndrome value and a second reliability value of the first check node based on the received bit decisions and first reliability values, and outputting the calculated syndrome value and second reliability value of the first check node to a variable node of the plurality of variable nodes but not of the subset of variable nodes; and updating the first variable node by receiving, by the first variable node, a syndrome value and a second reliability value of a second check node among the plurality of check nodes, and updating the first reliability value of the first variable node based on the syndrome value and the second reliability value of the second check node.


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