The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Mar. 29, 2019
Topcon Positioning Systems, Inc., Livermore, CA (US);
Mark Isaakovich Zhodzishsky, Moscow, RU;
Vladimir Victorovich Beloglazov, Moscow, RU;
Danila Svyatoslavovich Milyutin, Moscow, RU;
Roman Valerievich Kurynin, Moscow, RU;
Vadim Borisovish Kuzmitchev, Moscow, RU;
Sergey Viktorovich Rogachkov, Moscow, RU;
Topcon Positioning Systems, Inc., Livermore, CA (US);
Abstract
A method and system are provided for estimating the g-sensitivity of a quartz oscillator, which includes rotating the quartz oscillator successively around each of a plurality of axes constituting a full-rank system, measuring a frequency of the quartz oscillator at a predetermined rate as a function of time during rotation, and estimating an integral g-sensitivity vector while the quartz oscillator is rotated. Estimation can be performed utilizing a data fitting and estimation model, e.g., a Least Square Method (LSM) in one example, using the frequency measurements obtained while the quartz oscillator is in rotation around the axes. The method and system are especially useful for measuring g-sensitivity of quartz oscillators that are incorporated in high-precision systems, such as navigation receivers, which operate in environments that are subjected to vibrational effects and other mechanical forces.