The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Mar. 13, 2018
Applicant:

Toyoda Gosei Co., Ltd., Kiyosu, JP;

Inventors:

Tohru Oka, Kiyosu, JP;

Nariaki Tanaka, Kiyosu, JP;

Junya Nishii, Kiyosu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 21/225 (2006.01); H01L 29/20 (2006.01); H01L 29/207 (2006.01); H01L 21/265 (2006.01); H01L 21/266 (2006.01); H01L 29/739 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0626 (2013.01); H01L 21/2258 (2013.01); H01L 21/266 (2013.01); H01L 21/26546 (2013.01); H01L 29/0623 (2013.01); H01L 29/2003 (2013.01); H01L 29/207 (2013.01); H01L 29/7397 (2013.01); H01L 29/7811 (2013.01); H01L 29/7813 (2013.01);
Abstract

A method for manufacturing a semiconductor device having a edge termination region comprises a stacking process, an ion implantation process, and a heat treatment process. In the stacking process, a p-type semiconductor layer containing a p-type impurity is stacked on an n-type semiconductor layer containing an n-type impurity. In the ion implantation process, at least one of the n-type impurity and the p-type impurity is ion-implanted into the p-type semiconductor layer located in the edge termination region. The ion implantation process and the heat treatment process are performed such that the p-type impurity of the p-type semiconductor layer is diffused into the n-type semiconductor layer to form a p-type impurity containing region in at least part of the n-type semiconductor layer and below a region of the p-type semiconductor layer into which the ion implantation has been performed.


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