The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

May. 03, 2019
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Takeaki Itsuji, Hiratsuka, JP;

Noriyuki Kaifu, Atsugi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H04N 5/225 (2006.01); H04N 5/341 (2011.01); G01N 21/3581 (2014.01); A61B 5/05 (2006.01); G01S 13/89 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14605 (2013.01); A61B 5/05 (2013.01); G01N 21/01 (2013.01); G01N 21/3581 (2013.01); G01S 13/89 (2013.01); H04N 5/2254 (2013.01); H04N 5/341 (2013.01);
Abstract

An image capture devicecaptures an image by using a terahertz wave and includes a generating unitthat includes a plurality of generation elements each of which generates the terahertz wave and rests on a resting planean irradiation optical systemthat irradiates an object with the terahertz wave, an imaging optical systemthat images the terahertz wave that is reflected from the object, and a sensorthat includes pixels. The plurality of generation elements include at least a first generation elementand a second generation elementthat have different angles of radiation to the object. There is an overlap region in which a region of radiation of a first terahertz wavefrom the first generation element to the object overlaps a region of radiation of a second terahertz wavefrom the second generation element to the object.


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