The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Nov. 23, 2016
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Srinivas D. Nemani, Sunnyvale, CA (US);

Gautam Pisharody, Newark, CA (US);

Seshadri Ramaswami, Saratoga, CA (US);

Shambhu N. Roy, Fremont, CA (US);

Niranjan Kumar, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/683 (2006.01); G01R 29/12 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67288 (2013.01); G01R 29/12 (2013.01); H01L 21/67253 (2013.01); H01L 21/6831 (2013.01); H01L 21/6833 (2013.01); H01L 21/6838 (2013.01);
Abstract

An electrostatic chucking force tool is described that may be used on workpiece carriers for micromechanical and semiconductor processing. One example includes a workpiece fitting to hold a workpiece when gripped by an electrostatic chucking force by an electrostatic chuck, an arm coupled to the workpiece fitting to pull the workpiece through the workpiece fitting laterally across the chuck, and a force gauge coupled to the arm to measure an amount of force with which the workpiece fitting is pulled by the arm in order to move the workpiece.


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