The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

May. 10, 2017
Applicant:

Focus-ebeam Technology (Beijing) Co., Ltd., Beijing, CN;

Inventors:

Wei He, Beijing, CN;

Shuai Li, Beijing, CN;

Peng Wang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/18 (2006.01); H01J 37/20 (2006.01); H01J 37/28 (2006.01); G01N 23/2251 (2018.01); H01J 37/147 (2006.01); H01J 37/22 (2006.01); G02B 21/00 (2006.01); H01J 37/26 (2006.01); G01N 21/64 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
H01J 37/28 (2013.01); G01N 23/2251 (2013.01); G02B 21/00 (2013.01); H01J 37/147 (2013.01); H01J 37/18 (2013.01); H01J 37/20 (2013.01); H01J 37/228 (2013.01); H01J 37/26 (2013.01); G01N 21/6458 (2013.01); G01N 21/65 (2013.01); H01J 2237/04922 (2013.01); H01J 2237/182 (2013.01); H01J 2237/2006 (2013.01); H01J 2237/24475 (2013.01);
Abstract

Disclosed is a charged particle beam system, which includes: a particle source, a column and a specimen chamber with a first movable vacuum window. The particle source is configured to generate a charged particle beam which impinges the specimen to be detected placed in a specimen chamber. The column includes a deflection device for deflecting the charged particle beam and a focusing device for focusing the charged particle beam. The charged particle beam system is compatible with multiple external optical systems to achieve simultaneous detection or fast-switching detection of the specimen. An opto-electro simultaneous detection system and the method are also disclosed.


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