The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
May. 30, 2019
Adobe Inc., San Jose, CA (US);
Vineet Batra, Pitam Pura, IN;
Matthew David Fisher, Palo Alto, CA (US);
Kevin John Wampler, Seattle, WA (US);
Daniel M. Kaufman, Seattle, WA (US);
Ankit Phogat, Noida, IN;
Adobe Inc., San Jose, CA (US);
Abstract
Systems and techniques are described herein for generating a triangle mesh for an image represented by curves (e.g., Bezier segments). An outline of an image is determined and reduced to a set of connected polylines that are efficiently represented in an edge list. A triangle mesh is generated based on the edge list, rather than by directly sampling the curves of the image and using the samples as vertices of triangles. Thus, the triangle mesh is generated with a number of triangles independent from a number of curves representing the image. Samples of the curves are bound to the triangle mesh by representing the samples with barycentric coordinates with respect to a triangle in the mesh. Hence, once a mesh is deformed, locations of the samples are determined from the barycentric coordinates and triangles in the deformed mesh, and used to reconstruct the curves of the deformed image.