The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Oct. 26, 2017
United Technologies Corporation, Farmington, CT (US);
Joseph D. Drescher, Middletown, CT (US);
Kenneth A. Frisk, West Hartford, CT (US);
United Technologies Corporation, Farmington, CT (US);
Abstract
A method of evaluating an article includes measuring a feature of the article using a defect detection device. A set of data points is recorded representing the first feature and the set of data points is analyzed. The analyzing includes constructing a filtered curve by constructing a raw curve by listing the set of data points, constructing a first meanline curve, and finding a first difference between the raw curve and the first meanline curve. The analyzing also includes constructing a reversal curve by calculating a second derivative of a meanline curve constructed from the set of data points. The method also includes deciding the acceptability of the feature of the article.