The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Apr. 26, 2019
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Zijin Yuan, Shenzhen, CN;

Weihua Jian, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06T 3/40 (2006.01); G06T 7/11 (2017.01); G06K 9/46 (2006.01); G06T 7/13 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G06K 9/46 (2013.01); G06T 7/11 (2017.01); G06T 7/13 (2017.01); G06T 7/593 (2017.01);
Abstract

Embodiments of this application disclose an image splicing method and apparatus, a terminal, and a storage medium thereof. The image splicing method includes determining a primary position parameter of a current image according to a first overlapped region in the current image; and projecting the current image to a projection canvas according to the primary position parameter to obtain an initial spliced image, the initial spliced image being obtained by splicing the current image and the neighboring image. The method further includes selecting a partially overlapped region from a second overlapped region of the initial spliced image; calculating a partial position parameter of a partial image region corresponding to the partially overlapped region in the current image; and projecting the current image to the projection canvas again according to the primary position parameter and the partial position parameter, to obtain a target spliced image.


Find Patent Forward Citations

Loading…