The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Sep. 28, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jaganathan Vellagoundar, Bangalore, IN;

Ashok Kumar P. Kumar Reddy, Bangalore, IN;

Manivannan Jayapalan, Bangalore, IN;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); G16H 30/20 (2018.01); G16H 40/20 (2018.01); G16H 30/40 (2018.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06T 7/0012 (2013.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 40/20 (2018.01);
Abstract

Apparatus, systems, and methods for improved imaging device configuration are disclosed and described. An example apparatus includes a memory storing a first neural network that is trained to map image quality metrics to corresponding scan parameters. The example apparatus includes a processor configured to: receive specified image quality metrics; instruct the trained first neural network to generate scan parameters based on the specified image quality metrics to configure an imaging device for image acquisition; and instruct the imaging device to acquire one or more resulting images using the generated scan parameters.


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