The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Sep. 12, 2018
Cognex Corporation, Natick, MA (US);
Andrew Hoelscher, Somerville, MA (US);
Nathaniel Bogan, Natick, MA (US);
Cognex Corporation, Natick, MA (US);
Abstract
The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a three-dimensional model. A three-dimensional model is stored, the three dimensional model comprising a set of probes. Three-dimensional data of an object is received, the three-dimensional data comprising a set of data entries. The three-dimensional data is converted into a set of fields, comprising generating a first field comprising a first set of values, where each value of the first set of values is indicative of a first characteristic of an associated one or more data entries from the set of data entries, and generating a second field comprising a second set of values, where each second value of the second set of values is indicative of a second characteristic of an associated one or more data entries from the set of data entries, wherein the second characteristic is different than the first characteristic. A pose of the three-dimensional model is tested with the set of fields, comprising testing the set of probes to the set of fields, to determine a score for the pose.