The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Oct. 17, 2018
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Masashi Kurita, Kizugawa, JP;

Yuki Hanzawa, Nara, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01); G06K 9/6254 (2013.01); G06K 9/6262 (2013.01); G06K 9/6263 (2013.01); G06K 2209/19 (2013.01);
Abstract

A data generation apparatus includes: an acquisition unit configured to acquire a result determined by a determination unit, which uses an identification device trained using learning data, as to whether or not an object to be inspected includes a part to be detected based on an image of the object to be inspected; an evaluation unit configured to evaluate whether or not the determination result is correct; and a generation unit configured to generate, if the evaluation unit has evaluated that the determination result is not correct, new learning data by associating at least one of the image and a composite image generated based on the image with information in which the determination result is corrected.


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