The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Jun. 07, 2017
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Yasuji Saito, Tokyo, JP;
Yuji Kaneda, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); H04N 9/804 (2006.01); H04N 5/765 (2006.01); H04N 5/91 (2006.01); G06T 7/20 (2017.01); H04N 7/18 (2006.01); G06K 9/00 (2006.01); G06K 9/20 (2006.01); G06K 9/62 (2006.01); H04N 5/917 (2006.01); H04N 7/01 (2006.01);
U.S. Cl.
CPC ...
G06K 9/36 (2013.01); G06K 9/00771 (2013.01); G06K 9/2054 (2013.01); G06K 9/6215 (2013.01); G06T 7/20 (2013.01); H04N 5/765 (2013.01); H04N 5/91 (2013.01); H04N 5/917 (2013.01); H04N 7/0117 (2013.01); H04N 7/18 (2013.01); H04N 9/8042 (2013.01);
Abstract
A first analysis unit () acquires second image data. The second image data is generated by compressing first image data by a predetermined encoding method. Further, the first analysis unit () performs image analysis of the acquired second image data to detect second image data satisfying a first predetermined condition. A decoding unit () decodes second image data detected by the first analysis unit () into third image data having higher resolution than that of the second image data. In the second analysis (), the image analysis of the third image data is performed.