The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Apr. 07, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

David Hoffman, Raleigh, NC (US);

Feng Li, Beijing, CN;

Ta-Hsin Li, Danbury, CT (US);

Nianjun Zhou, Danbury, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 17/10 (2006.01); G06Q 50/00 (2012.01); G06Q 10/06 (2012.01); G06Q 10/10 (2012.01); G06Q 30/02 (2012.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 17/10 (2013.01); G06Q 10/067 (2013.01); G06Q 10/10 (2013.01); G06Q 30/0279 (2013.01); G06Q 50/01 (2013.01); G06F 2111/10 (2020.01);
Abstract

A method for simulating participation patterns in a plurality of events from a pool of qualified participants includes selecting an event whose preference rank r is equal to a predetermined preference rank R(i,j) for an event of type j for individual i; sampling a random number Z that represents a number of events in which to participate when a number N(j) of available events of type j is greater than 0 and an expected participation rate P(i, j) of individual i for events of type j is greater than 0; selecting a random subset S with Z elements that indicates which Z events to participate in; and looping over k=1 to N(j) and setting a participation array M(i,j,k,l) to 1 iff k is contained in S, where participation array M(i,j,k,l) indicates whether or not individual i participates in a k-th event of type j in an l-th simulation.


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