The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

May. 16, 2017
Applicant:

Entit Software Llc, Sunnyvale, CA (US);

Inventors:

Pratyusa K. Manadhata, Piscataway, NJ (US);

Manish Marwah, Palo Alto, CA (US);

Alexander Ulanov, Palo Alto, CA (US);

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); H04L 29/06 (2006.01); G06Q 10/06 (2012.01); G06F 16/242 (2019.01); G06F 16/33 (2019.01); G06F 16/28 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 16/244 (2019.01); G06F 16/285 (2019.01); G06F 16/3334 (2019.01); G06F 16/9024 (2019.01); G06Q 10/0635 (2013.01); H04L 63/1416 (2013.01); H04L 63/1425 (2013.01); G06F 2221/2111 (2013.01); G06F 2221/2137 (2013.01);
Abstract

In some examples, a system receives anomaly scores regarding an entity from a plurality of detectors, produces a weighted anomaly score for the entity based on the anomaly scores and respective weights assigned to the plurality of detectors, the weights based on historical performance of the plurality of detectors, determines an impact based on a context of the entity, wherein the impact is indicative of an effect that the entity would have on a computing environment if the entity were to exhibit anomalous behavior, and computes a risk score for the entity based on the weighted anomaly score and the determined impact.


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