The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Apr. 29, 2014
Applicant:
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Inventor:
Jeffrey Michael Derstadt, Sammamish, WA (US);
Assignee:
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01);
Abstract
Identifying data quality along a data flow. A method includes identifying quality metadata for two or more datasets. The quality metadata defines one or more of quality of a data source, accuracy of a dataset, completeness of a dataset, freshness of a dataset, or relevance of a dataset. At least some of the metadata is based on results of operations along a data flow. Based on the metadata, the method includes creating one or more quality indexes for the datasets. The one or more quality indexes include a characterization of quality of two or more datasets.