The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Jan. 26, 2017
Honeywell International Inc., Morris Plains, NJ (US);
Matthew G. Burd, Calgary, CA;
Paul F. McLaughlin, Ambler, PA (US);
Honeywell International Inc., Charlotte, NC (US);
Abstract
A method of process monitoring of an industrial process involving a tangible run an industrial facility includes providing an integrated facility digital twin (DT) implemented by a computer system which implements an aggregation algorithm that utilizes models including a plurality of inter-related static models for the industrial facility including an asset model that describes devices and systems in the industrial facility including sensors coupled to processing equipment and a flowsheet model, and dynamic models of the industrial facility including calculation models, symptom and fault models, dynamic simulation models, and machine learning models. The aggregation algorithm using outputs from the static models and dynamic model, generates an aggregated view including performance alerts for at least one of the process equipment and industrial process based on a current performance of the industrial process.