The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Dec. 07, 2017
Applicant:

Hexagon Technology Center Gmbh, Heerbrugg, CH;

Inventors:

Claudio Iseli, Au, CH;

Thomas Ammer, Widnau, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G05B 19/418 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G01B 21/04 (2013.01); G05B 2219/32177 (2013.01); G05B 2219/32189 (2013.01); G05B 2219/32192 (2013.01); G05B 2219/32197 (2013.01); G05B 2219/37499 (2013.01); G05B 2219/37533 (2013.01); Y02P 90/02 (2015.11);
Abstract

A Self-monitoring manufacturing system adapted to produce at least one object. The system includes at least a first processing facility adapted to perform a respective first processing step with the object, and a production control unit, wherein the production data comprises nominal pre-processing object data. A production monitoring unit for checking a pre-processing object state of the object is arranged, such unit being adapted to obtain actual property data of the object in-line of the production in-advance of applying the first processing step, to generate deviation data by comparing the actual property data with the production data for the first processing step, and to provide the deviation data for performing the first production step with the first processing facility in deviation-adjusted manner.


Find Patent Forward Citations

Loading…