The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Feb. 27, 2018
Applicant:

Toshiba Memory Corporation, Tokyo, JP;

Inventor:

Yumi Nakajima, Yokkaichi Mie, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/16 (2006.01); G03F 1/58 (2012.01); G03F 1/52 (2012.01); G03F 1/24 (2012.01); G03F 7/20 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
G03F 7/161 (2013.01); G03F 1/24 (2013.01); G03F 1/52 (2013.01); G03F 1/58 (2013.01); G03F 7/201 (2013.01); G03F 7/16 (2013.01); G03F 7/70283 (2013.01); H01L 21/31144 (2013.01);
Abstract

A reflection type exposure mask includes a substrate, a reflective layer provided on the substrate, and a light absorption layer provided on the surface of the reflective layer. The light absorption layer includes a first absorber and a second absorber. The first absorber extends in a first direction along the surface of the reflective layer. The second absorber extends in a second direction along the surface of the reflective layer, which intersects with the first direction. The thickness of the second absorber in a third direction which is perpendicular to the surface of the reflective layer is thinner than the thickness of the first absorber in the third direction.


Find Patent Forward Citations

Nakajima, Yumi. (2020). Reflection type exposure mask and pattern forming method (U.S. Patent No. 10877375). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10877375

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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