The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Jul. 18, 2018
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventors:
Toshiyuki Hattori, Tokyo, JP;
Mina Kobayashi, Tokyo, JP;
Naohiro Ariga, Tokyo, JP;
Ayumu Sakurai, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/36 (2006.01); C12M 1/00 (2006.01); G02B 21/36 (2006.01); G02B 21/24 (2006.01); G06K 9/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/361 (2013.01); C12M 41/14 (2013.01); C12M 41/48 (2013.01); G02B 21/24 (2013.01); G02B 21/365 (2013.01); G02B 21/368 (2013.01); G02B 21/0004 (2013.01); G02B 21/367 (2013.01); G06K 9/00127 (2013.01);
Abstract
A microscope system includes a microscope apparatus configured to obtain a microscopic image of a culture cell by picking up an image of the culture cell, and a first control device configured to record a culture condition of the culture cell and the microscopic image in a recording unit in association with each other.