The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Apr. 04, 2016
Huron Technologies International Inc., Waterloo, CA;
Arthur Edward Dixon, Waterloo, CA;
Huron Technologies International Inc., Waterloo, unknown;
Abstract
An instrument for imaging a specimen or a portion of a specimen is configured to capture multiple image frames of the portion of the specimen being scanned using Moving Specimen Image Average (MSIA) to create one or more image strips. The instrument is configured to use an active area of a two dimensional sensor array that covers substantially all of the width of the sensor array but less than a length. The one or more image strips are created from the multiple image frames as each of the multiple image frames is captured. Preferably, the instrument is configured to remove blurring, caused by distortion of the optics, by software or by warping a grid of the two dimensional detector array, including TDI array.