The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
May. 02, 2018
Queen's University AT Kingston, Kingston, CA;
Mehdi Moradi, Vancouver, CA;
Purang Abolmaesumi, Vancouver, CA;
Parvin Mousavi, Kingston, CA;
Eric Sauerbrei, Kingston, CA;
Robert Siemens, Kingston, CA;
Phillip Isotalo, Kingston, CA;
Queen's University at Kingston, Kingston, CA;
Abstract
This invention relates to a method of analyzing an ultrasound signal. The method comprises obtaining a time series of sequential data frames associated with an ultrasound signal reflected from and/or backscattered from a fixed location of a material under investigation, each data frame comprising a plurality of samples of the ultrasound signal, and subjecting to an analysis a sequence of one or more samples of the ultrasound signal, or a sequence of at least one parameter derived from one or more samples of the ultrasound signal, wherein a result of the analysis is related to one or properties or characteristics of the material. In one embodiment the method may be used for detecting, diagnosing, and/or assessing cancer and/or abnormalities in biological tissue.