The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Oct. 24, 2019
Applicant:

Fischer Block, Inc., Royersford, PA (US);

Inventors:

Margaret Paietta, Royersford, PA (US);

Gregory Wolfe, Royersford, PA (US);

Assignee:

Fischer Block, Inc., Royersford, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/327 (2006.01); G01R 1/20 (2006.01); G01R 15/14 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3278 (2013.01); G01R 1/206 (2013.01); G01R 15/142 (2013.01); G01R 19/00 (2013.01);
Abstract

In one embodiment, there is a test switch signal analyzer comprising: an analyzer hub operably couplable to a test switch base that includes a plurality of test switch conductors; at least one signal probe operatively couplable to the analyzer hub and to at least one of the plurality of test switch conductors when the analyzer hub is coupled to the test switch base, each of the at least one signal probes being configured to receive electrical signals from one of the plurality of test switch conductors and to generate one or more probe signals that corresponds to the received electrical signals; a signal processing unit coupled to the analyzer hub and configured to receive the one or more probe signals from the at least one signal probe, the signal processing unit configured to determine a plurality of electrical signal values based on the probe signals received from the at least one signal probe; the signal processing unit, the analyzer hub, and at least a portion of the at least one signal probe being positionable within a test switch cover configured and dimensioned to mate with the test switch base when the at least one signal probe is coupled to the at least one of the plurality of test switch conductors and the test switch cover is secured to the test switch base.


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