The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Oct. 10, 2018
Airbus Helicopters, Marignane, FR;
Laurent Bianchi, Marseilles, FR;
Sebastien Bernier, Pertuis, FR;
John Enderby, Bristol, GB;
Mark Bowes, Carmarthenshire, GB;
Dawood Parker, Carmarthenshire, GB;
AIRBUS HELICOPTERS, Marignane, FR;
Abstract
A method for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The method uses a database with predetermined reference values and a probe that comprises a capacitive measuring apparatus with at least two coplanar electrodes. The method includes the operations of placing the at least two coplanar electrodes into a first position that is at a predetermined distance from the test object, performing a capacitive measurement to determine an effective dielectric constant, retrieving a reference value of the predetermined reference values from the database based on the test object and the predetermined distance, and detecting imperfections in the test object based on a comparison of the effective dielectric constant with the reference value.