The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Jan. 31, 2019
Applicant:

The Industry & Academic Cooperation IN Chungnam National University (Iac), Daejeon, KR;

Inventors:

Yung-Eun Sung, Seoul, KR;

Jungjin Park, Seoul, KR;

Chunjoong Kim, Daejeon, KR;

Jong Sig Lee, Gyeonggi-do, KR;

Jae-Hyuk Park, Incheon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2018.01); G01N 23/20025 (2018.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G01N 23/20025 (2013.01); G01N 2223/60 (2013.01);
Abstract

Provided is an in-situ X-ray analysis apparatus including a potentiostat connected to an in-situ electrochemical cell and configured to adjust voltage, current, and time of the in-situ electrochemical cell or to record information regarding voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell; an X-ray analysis apparatus configured to obtain X-ray diffraction information regarding the in-situ electrochemical cell; and a controller connected to the X-ray analysis apparatus and the potentiostat and configured to provide or receive signals to or from the X-ray analysis apparatus and the potentiostat.


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