The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Jul. 20, 2018
Hitachi High-tech Science Corporation, Tokyo, JP;
HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo, JP;
Abstract
To acquire both excellent spectrum and sample image reflecting actual conditions of a sample, and to increase convenience of measurement, provided is a display device for a photometric analyzer, which is configured to irradiate a sample with light to analyze the sample, the display device being configured to display a measurement result of the photometric analyzer, and including: a controller; and a display, which is configured to display an image based on measurement data processed by the controller. The measurement data at least contains a spectrum indicating an intensity of emitted light, which is emitted by the sample irradiated with the light, and a sample image of the sample, which is taken by an imaging device. The display is configured to display the spectrum and the sample image in an arrangement in the same screen.