The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Feb. 28, 2018
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Yosuke Muraki, Tokyo, JP;

Akiko Tsuji, Kanagawa, JP;

Takashi Miyata, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); B03C 7/00 (2006.01); G01N 15/00 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1425 (2013.01); B03C 7/003 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1081 (2013.01); G01N 2015/144 (2013.01); G01N 2015/149 (2013.01); G01N 2015/1481 (2013.01);
Abstract

A microparticle sorting apparatus includes a detection unit which detects microparticles flowing through a flow path; an imaging device which images a droplet containing the microparticles which is discharged from an orifice provided on an edge portion of the flow path; a charge unit which applies a charge to the droplets; and a control unit which determines a delay time as from a time that the microparticles are detected by the detection unit to the time at which a number of bright spots in a standard region, which is set beforehand, of image information imaged by the imaging device reaches the maximum, making it possible for the charge unit to apply a charge to the microparticles once the delay time has lapsed after the microparticles are detected by the detection unit.


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