The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Feb. 08, 2019
Applicant:
Amo Groningen B.v., Groningen, NL;
Inventors:
Robert Rosen, Groningen, NL;
Mihai State, Groningen, NL;
Assignee:
AMO Groningen B.V., Groningen, NL;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01M 11/02 (2006.01); G01N 21/958 (2006.01); G01N 21/59 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/025 (2013.01); G01M 11/005 (2013.01); G01M 11/02 (2013.01); G01N 21/55 (2013.01); G01N 21/59 (2013.01); G01N 21/958 (2013.01); G01N 2021/9583 (2013.01);
Abstract
A wavefront based characterization of surfaces based on reflections. An intraocular lens surface measurement system includes a light source configured to emit light that is reflected off an optical surface of an intraocular lens. A wavefront sensor is configured to receive the light that is reflected off the optical surface of the intraocular lens. A processor is configured to determine one or more characteristics of the optical surface of the intraocular lens based on a wavefront of the reflected light that is received by the wavefront sensor.