The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Apr. 30, 2018
International Business Machines Corporation, Armonk, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, computer program products, and devices for in-pipeline optical interference-based cognitive systems for leak and defect detection are provided herein. A computer-implemented method includes obtaining optical interference-related data pertaining to at least one interior portion of a pipeline; obtaining multiple items of sensor data pertaining to the at least one interior portion of the pipeline; generating one or more pipeline-irregularity predictions by applying an inference-based algorithm to the optical interference-related data, the multiple items of sensor data, and one or more additional items of data, wherein each of the one or more pipeline-irregularity predictions comprises an identified location within the interior surface of the pipeline of a predicted irregularity and an estimated size of the predicted irregularity; and outputting the one or more pipeline-irregularity predictions to one or more users.